People

Prof Dr. Wolfgang Jäger, Former academic staff

Former academic staff | Faculty of Engineering

Prof Dr. Wolfgang Jäger (Germany, 1948)

founding member - emeritus

PhD project University of Stuttgart
Post-doc project Faculty of Engineering
Research interests Microanalysis of materials
Education

1977 - 1978
Post-Doctorate Scientist, Argonne National Laboratory, University of Chicago.

1972 - 1976
MPI for Metal Research Stuttgart, Ph.D. University of Stuttgart 1976.

1966 - 1972
University of Stuttgart, Physics (Diploma 1972).

Work experience

Contracts and functions: Since 1996
Professor, Head of Microanalysis of Materials Group CAU Kiel.

1979 - 1996
Staff researcher and group leader Institut für Festkörperforschung, Forschungszentrum Jülich.

Projects: Since 1996
Microstructure research for functional materials, thin film systems and interfaces electron microscopy, nanoanalytics in materials science and surface science.

1989 - 1996
Microstructure research and electron microscopy of semiconductors and semiconductor heterostructures: diffusion, ion implantation, epitaxial growth.

1979 - 1989
Ion implantation of metals, ion-beam assisted metal film growth self-organization phenomena of defects in metals under particle bombardment.

1970 - 1979
Properties of metals under electron, light ion and heavy ion irradiation.

Selected publications

2009
Häußler, D., Morawe, Ch., Roß, U., Ögüt, B., Spiecker, E., Jäger, W.,Hertlein, F., Heidorn, U., Wiesmann, J.: Aperiodic W/B4C multilayer sytems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity, Surface and Coatings Technology, SCT-15339.

2009
Ortega, Y., Dieker, Ch., Fernandez, P., Piqueras, J., Jäger, W.: TEM and CL Investigation of Doped ZnO Nanostructures, Microscopy Conference MC 2009 Graz, Volume 3: Materials Science 3: 429-430.

2009
Roß, U., Häußler, D., Spiecker, E., Jäger, W., Ögüt, B. Morawe, C., Hertlein, F., Wiesmann, J., Heidorn, U.: Nano-Scaled Aperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM, Microscopy Conference MC 2009 Graz, Volume 3: Materials Science 3: 443-444.

2009
Häußler, D., Roß, U., Ögüt, B., Spiecker, E., Jäger, W., Morawe, C., Hertlein, F., Wiesmann, J., Störmer, M.: Quantitative Transmission Electron Microscopy of Multilayer Coatings for X-ray Optics, 11th Int. Conf. on Advanced Materials ICAM2009, Rio de Janeiro, Brazil.

2009
Roß, U., Häußler, D., Spiecker, E., Jäger, W., Ögüt, B., Morawe, C., Hertlein, F., Wiesmann, J., Heidorn, U.: Nano-Scaled Aperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM, Proc. 1st MACAN Conference on Interfaces (FP7-NMP-2009-CSA-233484 MACAN), Berlin, Germany, 69.

2009
Zeng, Y. J., Ye, Z. Z., Liu, F., Li, D. Y., Lu, Y. F., Jäger, W., He, H. P., Zhu, L. P., Huang, J. Y., Zhao, B. H.: Controllable Growth and Characterization of ZnO/MgO Quasi Core-Shell Quantum Dots, Crystal Growth and Design, 9: 263-266

2009
Jäger, W., Spiecker, E., Häußler, D.: Faszination Nanokosmos - Elektronenmikroskopie und Nanoanalytik in der Materialforschung, Christiana Albertina, 68: 17.

2008
Garbrecht, M., Spiecker, E., Jäger, W., Tillmann, K.: Aberration-corrected HRTEM of the incommensurate misfit layer compound PbS 1.14NbS2. In: Snoeck, E., Dunin-Borkowski, R., Verbeeck, J. and U. Dahmen (eds.): Quantitative Electron Microscopy for Materials Science, Mater. Res. Soc. Symp. Proc. Vol. 1026, 1026-C10-01.

2008
Schöne, J., Spiecker, E., Dimroth, F., Bett, A. W. and W. Jäger: Misfit Dislocation Blocking by Dilute Nitride Intermediate Layers. Applied Physics Letters 92: 081905.

2007
Häussler, D., Spiecker, E., Jäger, W., Störmer, M., Bormann, R., Michaelsen, C., Wiesmann, J., Zwicker, G., Benbalagh, R., André, J.-M., Jonnard, P.: Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method. Microel. Eng. 84: 454-459.

Theses 
(co-)supervised

In progress
Magnus Garbrecht: Aberration-corrected high-resolution transmission electron microscopy of the misfit layered compound (PbS)1.14NbS2, Ph.D. thesis project.

In progress
Jan Schöne: Hocheffiziente Mehrfach-Solarzellen: Mikrostruktur-untersuchungen mittels Transmissionselektronenmikroskopie und hochauflösender Röntgenbeugung, Ph.D. thesis project.

2007
Dr. habil. Erdmann Spiecker: Development of Quantitative TEM Techniques and Their Use in Microstructure Studies of Thin Film Materials, Habilitation.

2006
Vasfi Burak Özdöl (2006): Multilayer systems for X-ray optics: Characterization of ultrathin W-Si multilayer systems by transmission electron microscopy; Master thesis, 1.

2005
Yumei Xie (2005): Transmission electron microscopy characterization of sputter-deposited Ru/C multilayers on planar Si (001) substrates; Master thesis, 1.

2005
Ayse Evrim Örs (2005): Multilayer systems for X-ray optics: Microstructure characterizations of ultrathin Ru-C multilayers by cross-section TEM; Master thesis, 1. S. Rajagopalan (2005): TEM investigations of semiconductor layer systems; Master thesis, 1.

2005
Jan Schöne (2005): GaInP/GaInAs/Ge-Heterostrukturen für Tripelsolarzellen: Mikrostruktur-untersuchungen mittels Transmissionselektronenmikroskopie und hochauflösender Röntgenbeugung; Diploma, 1 (First Prize of Prof. Werner-Petersen-Preise der Technik 2005).

2005
Frank Dietz (2005): Elektronenmikroskopische Untersuchung der Nukleation von Au-Nanostrukturen an Faltennetzwerken auf VSe2-Schichtkristallen; Diploma, 1.

2004
Shangjong Yang (2004): La-B4C nanolayers on structured Si(100) substrates for X-ray optics: characterisations by TEM, SEM and AFM; Master thesis, 1.

2002
Christian Jäger (2002): Untersuchungen diffusionsinduzierter Defekte in Galliumphosphid mittels Transmissionselektronenmikroskopie; Ph.D. Thesis, magna cum laude.

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