Selected publications |
2009
Häußler, D., Morawe, Ch., Roß, U., Ögüt, B., Spiecker, E., Jäger, W.,Hertlein, F., Heidorn, U., Wiesmann, J.: Aperiodic W/B4C multilayer sytems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity, Surface and Coatings Technology, SCT-15339.
2009
Ortega, Y., Dieker, Ch., Fernandez, P., Piqueras, J., Jäger, W.: TEM and CL Investigation of Doped ZnO Nanostructures, Microscopy Conference MC 2009 Graz, Volume 3: Materials Science 3: 429-430.
2009
Roß, U., Häußler, D., Spiecker, E., Jäger, W., Ögüt, B. Morawe, C., Hertlein, F., Wiesmann, J., Heidorn, U.: Nano-Scaled Aperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM, Microscopy Conference MC 2009 Graz, Volume 3: Materials Science 3: 443-444.
2009
Häußler, D., Roß, U., Ögüt, B., Spiecker, E., Jäger, W., Morawe, C., Hertlein, F., Wiesmann, J., Störmer, M.: Quantitative Transmission Electron Microscopy of Multilayer Coatings for X-ray Optics, 11th Int. Conf. on Advanced Materials ICAM2009, Rio de Janeiro, Brazil.
2009
Roß, U., Häußler, D., Spiecker, E., Jäger, W., Ögüt, B., Morawe, C., Hertlein, F., Wiesmann, J., Heidorn, U.: Nano-Scaled Aperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM, Proc. 1st MACAN Conference on Interfaces (FP7-NMP-2009-CSA-233484 MACAN), Berlin, Germany, 69.
2009
Zeng, Y. J., Ye, Z. Z., Liu, F., Li, D. Y., Lu, Y. F., Jäger, W., He, H. P., Zhu, L. P., Huang, J. Y., Zhao, B. H.: Controllable Growth and Characterization of ZnO/MgO Quasi Core-Shell Quantum Dots, Crystal Growth and Design, 9: 263-266
2009
Jäger, W., Spiecker, E., Häußler, D.: Faszination Nanokosmos - Elektronenmikroskopie und Nanoanalytik in der Materialforschung, Christiana Albertina, 68: 17.
2008
Garbrecht, M., Spiecker, E., Jäger, W., Tillmann, K.: Aberration-corrected HRTEM of the incommensurate misfit layer compound PbS 1.14NbS2. In: Snoeck, E., Dunin-Borkowski, R., Verbeeck, J. and U. Dahmen (eds.): Quantitative Electron Microscopy for Materials Science, Mater. Res. Soc. Symp. Proc. Vol. 1026, 1026-C10-01.
2008
Schöne, J., Spiecker, E., Dimroth, F., Bett, A. W. and W. Jäger: Misfit Dislocation Blocking by Dilute Nitride Intermediate Layers. Applied Physics Letters 92: 081905.
2007
Häussler, D., Spiecker, E., Jäger, W., Störmer, M., Bormann, R., Michaelsen, C., Wiesmann, J., Zwicker, G., Benbalagh, R., André, J.-M., Jonnard, P.: Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method. Microel. Eng. 84: 454-459. |